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SPIE精选(英文原版),包括了光电行业各专业知识!

Proceedings of SPIE, Volume 3677,
Metrology, Inspection, and Process Control for Microlithography XIII. Bhanwar Singh. SPIE, 1999.

Proceedings of SPIE, Volume 3913,
Progress in Biomedical Optics and Imaging, Vol. 1, No. 7,  In-Vitro Diagnostic Intrumentation. Gerald E Cohn. SPIE, 2000

Proceedings of SPIE, Volume 3998,
Metrology, Inspection, and Process Control for Microlithograph XIV. Neal T Sullivan. SPIE, 2000

Proceedings of SPIE, Volume 4342,
Optical Data Storage 2001. Terril Hurst. SPIE, 2001.

Proceedings of SPIE, Volume 4354,
Laser Optics 2000, Semiconductor lasers and optical communication. Serguei A Gurevich. SPIE, 2000.

Proceedings of SPIE, Volume 4620,
Progress in Biomedical Optics and Imaging, Vol. 3, No. 12, Multiphoton Microscopy in the Biomedical Sciences II. Ammasi Periasamy. SPIE, 2002.

Proceedings of SPIE, Volume 4632,
Laser and Beam Control Technologies. Santanu Basu. SPIE, 2002.

Proceedings of SPIE, Volume 4659,
Practical Holography XVI and Holographic Materials VIII. Stephen A Benton. SPIE, 2002.

Proceedings of SPIE, Volume 4675,
Security and Watermarking of Multimedia Contents IV. Edward J Delp. SPIE, 2002.

Proceedings of SPIE, Volume 4770,
Laser Beam Shaping III. Fred M Dickey. SPIE, 2002.

Proceedings of SPIE, Volume 4789,
Algorithms and Systems for Optical Information Processing VI. Bahram Javidi. SPIE, 2002.

Proceedings of SPIE, Volume 4985,
MOEMS Display and Imaging Systems. Hakan Urey. SPIE, 2003.

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本文章由 焦点光学 于2011年01月05日发布在技术文档分类下, 通告目前不可用,你可以至底部留下评论。
转载请注明:SPIE精选(英文原版),包括了光电行业各专业知识!-南京波长光电科技股份有限公司武汉事业部
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